Representative scans obtained with Xidex's CNT AFM tips:

	These figures show scan data obtained by SEMATECH on SEMATECH's X3D AFM. Xidex's SXM AFM was used for rendering and analysis.

This figure shows a typical scan obtained with a Xidex CNT tip on an X3D AFM. The scan was conducted by SEMATECH on a grating sample with 2 µm pitch.